Variation-Aware Advanced CMOS Devices and SRAM by Changhwan Shin

Author:Changhwan Shin
Language: eng
Format: epub
Publisher: Springer Netherlands, Dordrecht

References

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De V, Borkar S (1999) Technology and design challenges for low power and high performance. In: Proceedings of the 1999 international symposium on low power electronics and design, pp 163–168

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Hicks J, Bergstrom D, Hattendorf M, Jopling J, Maiz J, Pae S, Prasad C, Wiedemer J (2008) 45 nm transistor reliability. Intel Technol J 12(2):131–144

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Pidin S, Morisaki Y, Sugita Y, Aiyama T, Irino K, Nakamura T, Sugii T (2002) Low standby power CMOS with HfO2 gate oxide for 100-nm generation. In: Symposium on VLSI technology of digest, pp 28–29

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